RF Basic set
Basic set of near-field probes 30 MHz to 3 GHz
-
-
Measurement set-up near field probe -
Application RF-U 2,5-2
Short description
The Basic Set Near-Field Probes 30 MHz to 3 GHz includes six passive near-field probes for development-related measurements of electric and magnetic fields in the frequency range of 30 MHz to 3 GHz on electronic assemblies. The various probe heads of the set enable step-by-step localization of RF emission sources on an assembly and the investigation of coupling mechanisms.
The emission of the assembly is initially determined from a greater distance using the RF-R 400-1 and RF-E 02 probes. Subsequently, higher resolution probes such as the RF-R 3-2, RF-B 3-2, and RF-U 5-2 can be used to more precisely locate magnetic interference sources, while the RF-E 05 probe is used for electric interference sources. By carefully guiding the near-field probes, the magnetic field orientation and distribution on the electronic assembly can be determined.
The near-field probes are connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. However, the near-field probes do not have an internal 50 Ω termination resistor.
Scope of delivery
- 1x RF-R 400-1, H-Field Probe 30 MHz up to 3 GHz
- 1x RF-R 3-2, H-Field Probe 30 MHz up to 3 GHz
- 1x RF-B 3-2, H-Field Probe 30 MHz up to 3 GHz
- 1x RF-U 2.5-2, H-Field Probe 30 MHz up to 3 GHz
- 1x RF-E 02, E-Field Probe 30 MHz up to 1.5 GHz
- 1x RF-E 05, E-Field Probe 30 MHz up to 3 GHz
- 1x SMB-BNC 1 m, SMB-BNC Measurement Cable
- 1x Case 5, System Case Near-Field Probes for 5 Probes
Technical parameters
| Frequency range | 30 MHz ... 3 GHz |
| Connector | SMB, male, jack |
| Weight | 400 g |
| Sizes (L x W x H) | (24 x 19.5 x 6) cm |
Scope of delivery details
-
RF-R 400-1
H-Field Probe 30 MHz up to 3 GHz
Due to its large diameter (25 mm) the RF-R 400-1 H-field probe is highly sensitive and is suitable for measurements at distances up to 10 cm around assemblies and devices.
-
RF-R 3-2
H-Field Probe 30 MHz up to 3 GHz
The RF-R 3-2 near-field probe is used for the high-resolution measurement of RF magnetic fields directly on an assembly e.g. in range around pins and IC cases, conducting paths, decoupling capacitor and EMC components.
-
RF-B 3-2
H-Field Probe 30 MHz up to 3 GHz
The measurement coil of the RF-B 3-2 H-field probe is set at a 90° angle to the probe shaft. By positioning the probe head vertically, the measurement coil touches the surface of the printed circuit board directly. This allows for use at places on the surface of printed circuit boards, which are typ…
-
RF-U 2.5-2
H-Field Probe 30 MHz up to 3 GHz
The RF-U 2.5-2 near-field probe is designed for the selective measurements of RF currents in conducting paths, component connectors, SMD components, and IC-pins. The probe head has a magnetically active gap with an approx. width of 0.5 mm. To use, the head should be positioned directly onto the meas…
-
RF-E 02
E-Field Probe 30 MHz up to 1.5 GHz
The RF-E 02 near-field probe detects electrical fields that are decoupled from bus structures, larger components or supply surfaces. The electrode surface on the underside of the probe tip is approx. 2 cm x 5 cm. The probe functions best within distances of 1 cm - 2 cm from the component.
-
RF-E 05
E-Field Probe 30 MHz up to 3 GHz
The electrode at the underside of the probe head of the RF-E 05 has a width of approx. 0.5 mm. The E-fields of clocked lines, IC pins, and smaller components are precisely located. The RF-E 05 probe was developed for Langer scanner.