P603-1 / P750 set

RF Conducted Measurement IEC 61967-4, 1 Ohm / 150 Ohm

The probe set is used to measure conducted emissions (measurements with direct 1 Ohm/150 Ohm-coupling) according to IEC 61967-4 at IC pins. For the current and voltage measurement there is one respective probe available. Every Test-IC pin can be reached and contacted by the probe.

P603 / P750 set

RF Conducted Measurement Analysis, 1 Ohm / 150 Ohm

The probe set is used to measure conducted emissions (measurements with direct 1 Ohm/150 Ohm-coupling) at IC pins. For the current and voltage measurement there is one respective probe available. Every Test-IC pin can be reached and contacted by the probe.

S603 / S750 set

1 Ohm / 150 Ohm, Conducted RF Measurement acc. IEC 61967-4

The probe set is used to measure conducted emissions 1 Ohm/150 Ohm with the direct coupling method on IC pins. The S603 probe is used for current measurement and the S750 probe is used for voltage measurement.

P1601 / P1702 set

RF Field Emission up to 1 GHz

The RF field emission probe set consists of a magnetic field probe and an E field probe. They are used to measure respective near fields, which are coupled out by an IC in operation/ a running IC. The measured data help to assess the seperate emission of an IC according to the types of field. Measu…

P1602 / P1702 set

RF Field Emission up to 3 GHz

The RF field emission probe set consists of a magnetic field probe and an electric field probe. They are used to measure the respective radiated near fields of an IC in operation. The measured data help to assess separately the emissions of an IC according to field types. Measurements and all calcul…