The RF2 near-field probe set consists of four passive near-field probes for measuring magnetic fields from 30 MHz to 3 GHz on electronic assemblies during the development stage. The probe heads of the RF2 set allow for the step by step localization of RF magnetic-field interference sources on assemblies. The RF-R 400-1 and RF-R 50-1 probes can detect electromagnetic interference from greater distances. With their higher resolution, the RF-B 3-2 and RF-U 5-2 probes are designed to detect the interference sources more precisely. An electronic assembly´s field orientation and field distribution can be detected through specific use of the near-field probe. The near-field probes are small and handy. They have a current attenuating sheath and, therefore, are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.