RF-E 02
E-Field Probe 30 MHz up to 1.5 GHz
 
        				
        					
        						 
        					
        					
        						Short description
The RF-E 02 near-field probe detects electrical fields that are decoupled from bus structures, larger components or supply surfaces. The electrode surface on the underside of the probe tip is approx. 2 cm x 5 cm. The probe functions best within distances of 1 cm - 2 cm from the component.
The RF-E 02 is a passive near-field probe. In principle it has the same structure as the RF-E 05 and RF-E 10 probes. When measuring, the bottom surface of the probe head is positioned close to the measured object. This allows the E-field emitted by an assembly to be detected. To achieve a higher resolution, only the tip of the probe head should be held toward the measured object. The near-field probe is small and handy. It has a current attenuating sheath and, therefore, is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe does not have an internal terminating resistance of 50 Ω.
 
           
          ![Frequency response [dBµV] / [dBµV/mm]](/fileadmin/Bilder300/Disturbance emission_near field probe_RF-E 02_frequency response_en_wPZ.png?v=1761788442469) 
        									![E- field correction curve [dBµV/mm] / [dBµV]](/fileadmin/Bilder300/Disturbance emission_near field probe_RF-E 02_E-field correction curve_en_wPZ.png?v=1761788442469)