XF-U 2.5-1
H-Field Probe 30 MHz up to 6 GHz
![XF-U 2.5-1, H-Field Probe 30 MHz up to 6 GHz](/fileadmin/Bilder300/Disturbance emission_near field probe_XF-U 2.5-1_function_en_wPZ.png?v=1721133633554)
![Probe head](/fileadmin/Bilder300/2014 Sondenkopf XF-U 2,5-1_wPZ.jpg?v=1721133633554)
Short description
The XF-U 2.5-2 near-field probe is designed for the selective measurements of RF currents in conducting paths, component connectors, SMD components, and IC pins. The probe head has a magnetically active gap with an approx. width of 0.5 mm. To use, the head should be positioned directly onto the measured object.
The XF-U 2.5-2 is a passive near-field probe that is designed for SMD components (pins). The near-field probe is small and handy. It has a current attenuating sheath and, therefore, is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe has an internal terminating resistance.