Scanner Probes 30 MHz up to 3 GHz
The RFS set consits of three passive near field probes designed for the use in a measurement scanner during the development of E-field and magnetic field.
They are designed for frequency ranges of 30 MHz to 3 GHz. The probe heads of the RFS set allow for close measurements needed to correctly localize interference sources on an electronic assembly. They document the whole image of the device under test`s near field.
The scanner probes have a sheath current attenuation and are electrically shielded. They are connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance. The measuring signal can be increased with PA 203 or PA 303 preamplifier. On request further LFS, RFS, XFS, and SXS scanner probes are available.
| Frequency range | 30 MHz ... 3 GHz |
| Connector | SMA, male, jack |
Scanner Probe 30 MHz up to 3 GHz
The measurement coil of the RFS-B 3-2 H-field scanner probe is arranged orthogonally to the probe shaft. This allows the probe head to be positioned very close to the assembly and to achieve a strong coupling. The RFS-B 3-2 detects magnetic field lines, which exit the measuring object othogonally. M…
Scanner Probe 30 MHz up to 3 GHz
Using the approx. 4x4 mm electrode, which is located in the bottom of the RFS-E 03 probe head, E-fields from clocked lines, IC pins, and smaller components can be detected.
Scanner Probe 30 MHz up to 3 GHz
The RFS-R 50 H-field probe is designed for taking field measurements on assemblies, devices or cables at a distance of up to approx. 3 cm. The H-field probe can be used to identify larger components as sources of interference.
You can download the correction data for our special magnetic field probe types as xlsx-file.
And for User of our software "ChipScan" ( older versions than 3.0) please download here the correction data in fdi-format.