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XF-R 100-1

H-Field Probe 30 MHz up to 6 GHz

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  • XF-R 100-1, H-Field Probe 30 MHz up to 6 GHz
  • Probe head
    Probe head
XF-R 100-1, H-Field Probe 30 MHz up to 6 GHz Probe head
  • XF-R 100-1, H-Field Probe 30 MHz up to 6 GHz
  • Probe head
Short description

The XF-R 100-1 H-field probe is suitable for measurements around assemblies, devices or cables at a distance of up to approx. 3 cm. The H-field probe can identify larger components as potential sources of interference. The magnetic field probe has a very high bandwidth and linearity.

The XF-R 100-1 is a passive near-field probe. The probe head’s size, and thus its resolution range, is between that of the XF-R 400-1 (25 mm) and XF-R 3-1 (3mm) probes. The near-field probe is small and handy. It has a current attenuating sheath and, therefore, is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe has an internal terminating resistance.

Technical parameters
Frequency response [dBµV] / [dBµA/m] H-field correction curve [dBµA/m] / [dBµV] Current correction curve [dBµA] / [dBµV] Measuring principles
Frequency range 30 MHz ... 6 GHz
Resolution Ø ≈10 mm
Probe head dimensions: ≈ (10x10) mm
Connector - output SMA, female, jack
Frequency response [dBµV] / [dBµA/m] Frequency response [dBµV] / [dBµA/m]
H-field correction curve [dBµA/m] / [dBµV] H-field correction curve [dBµA/m] / [dBµV]
Current correction curve [dBµA] / [dBµV] Current correction curve [dBµA] / [dBµV]
Measuring principles Measuring principles