XF Product family
Near-Field Probes 30 MHz up to 6 GHz
Short description
The XF family consists of 5 passive magnetic field probes and 3 passive E field probes designed for measuring magnetic and E-fields in ranges from 30 MHz to 6 GHz during the development phase. Due to their integrated impendance matching the probes are less sensitive in the lower frequency range than the RF type probes. With its broard frequency spectrum and large to very small probe heads, the set covers a wide range of application. An induvidual probe set can be compiled according to any individual customer`s need. The probe heads of the XF family allow for the step by step identification of interference sources on an assembly. We recommend firstly, detecting interference sources on assemblies with the larger sensitive probes from a greater distance. Next, using higher resolution probes, the interference sources can be more precisely located. With trained use of the near field probes field orientation and field distribution on the electronic assembly can be detected. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They have an internal terminating resistance.
Scope of delivery
- 1x XF-E 04s, E-Field Probe 30 MHz up to 6 GHz
- 1x XF-E 09s, E-Field Probe 30 MHz up to 6 GHz
- 1x XF-E 10, E-Field Probe 30 MHz up to 6 GHz
- 1x XF-R 3-1, H-Field Probe 30 MHz up to 6 GHz
- 1x XF-R 100-1, H-Field Probe 30 MHz up to 6 GHz
- 1x XF-R 400-1, H-Field Probe 30 MHz up to 6 GHz
- 1x XF-U 2.5-1, H-Field Probe 30 MHz up to 6 GHz
- 1x XF-B 3-1, H-Field Probe 30 MHz up to 6 GHz
- 1x SMA-SMA 1 m, SMA-SMA Measuring Cable
- 1x Case CN, System Case Near-Field Probes
Technical parameters
| Frequency range | 30 MHz ... 6 GHz |
| Connector | SMA, male, jack |
Scope of delivery details
-
XF-E 04s
E-Field Probe 30 MHz up to 6 GHz
The electrode on the probe head of the XF-E 04s near-field probe detects electrical fields which, for example are decoupled above the IC's surface. The probe's resolution allows for measurements at a distance of 0.5 mm upto 10 mm above an assembly.
-
XF-E 09s
E-Field Probe 30 MHz up to 6 GHz
The electrode on the probe head of the XF-E 09s near-field probe detects electrical fields which, for example are decoupled above the IC's surface. The probe's resolution allows for measurements at a distance of 0.5 mm upto 10 mm above an assembly.
-
XF-E 10
E-Field Probe 30 MHz up to 6 GHz
The electrode in the probe head of the XF-E 10 has a width of approx. 0.2 mm. With the probe even smallest E-field sources can be located, e.g. conducting paths with a width of 0.1 mm or single pins on multi pinned ICs. To measure, the E-field probe is positioned onto the object.
-
XF-R 3-1
H-Field Probe 30 MHz up to 6 GHz
The XF-R 3-1 near-field probe is designed for direct high-resolution measurements of RF magnetic fields on an assembly, e.g. around the pins and IC cases, conducting paths, decoupling capacitor, and EMC components.
-
XF-R 100-1
H-Field Probe 30 MHz up to 6 GHz
The XF-R 100-1 H-field probe is suitable for measurements around assemblies, devices or cables at a distance of up to approx. 3 cm. The H-field probe can identify larger components as potential sources of interference. The magnetic field probe has a very high bandwidth and linearity.
-
XF-R 400-1
H-Field Probe 30 MHz up to 6 GHz
Due to its large diameter (25 mm) and its high resolution, the XF-R 400-1 H-field probe is suitable for measurements at distances up to 10 cm around assemblies and devices.
-
XF-U 2.5-1
H-Field Probe 30 MHz up to 6 GHz
The XF-U 2.5-2 near-field probe is designed for the selective measurements of RF currents in conducting paths, component connectors, SMD components, and IC pins. The probe head has a magnetically active gap with an approx. width of 0.5 mm. To use, the head should be positioned directly onto the meas…
-
XF-B 3-1
H-Field Probe 30 MHz up to 6 GHz
The measurement coil of the XF-B 3-1 H-field probe is set at a 90° angle to the probe shaft. By positioning the probe head vertically, the measurement coil touches the surface of the printed circuit board directly. This allows for use at places on the surface of printed circuit boards, which are ty…
-
SMA-SMA 1 m
SMA-SMA Measuring Cable
The "SMA-SMA 1 m" measuring cable is an RF cable with coaxial construction. The wave impedance is 50 ohm.
-
Case CN
System Case Near-Field Probes