H3 set
Field Sources
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Application with magnetic field source BS 04DB-h -
Application with E-field source ES 01-h -
Scope of delivery H3 set
Short description
The field sources are used to analyze the immunity of assemblies and devices by coupling pulse fields (ICE 61000-4-4) into the device under test. They must be guided by hand just above the device under test. The weak spot will react to the pulse field and malfunctions will be triggered.
An EFT/burst generator powers the field sources via a high voltage cable. The field sources have a SMB-output.
The connection cable for the field sources is available with a SHV connector (HV SHV-SMB 1 m) or with a Fischer connector (HV FI-SMB 1 m; Fischer connector S103A023). Please specify when ordering.
Different types of field source tips are offered for various measuring tasks. The tips allow for localization of the weak spots accurate to the millimeter and for detecting critical connections on the defined disturbing path, such as components, wires, or IC pins.
Scope of delivery
- 1x BS 02-h, Magnetic Field Source
- 1x BS 04DB-h, Magnetic Field Source
- 1x BS 05DB-h, Magnetic Field Source
- 1x BS 05DU-h, Magnetic Field Source
- 1x ES 00-h, E-Field Source
- 1x ES 01-h, E-Field Source
- 1x ES 02-h, E-Field Source
- 1x ES 05D-h, E-Field Source
- 1x ES 08D-h, E-Field Source
- 1x HV SHV-SMB 1 m, High-Voltage Cable, SHV SMB
- 1x H case, System Case
- 1x H3 m, H3 Set User Manual
Recommended products
Scope of delivery details
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BS 02-h
Magnetic Field Source
The BS 02-h is designed for identifying magnetic weak spots in PCB layouts. It generates a B-field of 5 cm in diameter which can be added to the housing surfaces, connectors, assemblies, and internal areas of the DUT to identify malfunctions.
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BS 04DB-h
Magnetic Field Source
The BS 04DB-h magnetic field source generates a B field with an area of approximately 3 mm. The field, which emerges from the probe`s front side, is used to scan the surface of the PCB. This allows for the localization and identification of magnetic weak spots in the layout and component areas (wiri…
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BS 05DB-h
Magnetic Field Source
The BS 05DB-h magnetic field source generates a small B field (approx. 1 mm) emitted from the probe head tip. It is, therefore, suitable for localizing dot-shaped weak spots. With the magnetic field generated by the probe, it is possible to scan the surface of printed circuit boards and components. …
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BS 05DU-h
Magnetic Field Source
The BS 05DU-h generates a small scale magnetic field of a few millimeters at its tip. It functions like a coupling clamp and is used for selective coupling of interference current in single conducting paths, IC pins, components and fine cables (flat cables).
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ES 00-h
E-Field Source
The ES 00-h can detect sensitive or weak E-field spots on the assemblies. Weak spots on an assembly can often be as large as 10-15 cm (LC-display, bus systems). The ES 00-h can be used to couple interference currents into assembly cables, for example.
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ES 01-h
E-Field Source
With the ES 01-h E field source extensive electrical couplings are possible. The field source is suitable for pulsing weak spots from a range of 5 to 10 cm. Its radius of function is between that of the ES 02-h and ES 00-h field sources.
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ES 02-h
E-Field Source
The surface of the field source head allows for extensive coupling into housing surfaces, connectors, conducting path structures and ICs (e.g. bus systems, LC-displays). Its tip can also be used to localize smaller, E-field sensitive structures (conducting paths, quartz, pull-up resistors, ICs).
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ES 05D-h
E-Field Source
The ES 05D-h E-field source has a small decoupling electrode in its head. It can, therefore, be positioned onto conducting paths, small components and their connections, wires and single components. Single plugs or cable cores of flat cables can be tested.
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ES 08D-h
E-Field Source
The ES 08-h E field source is a test probe to determine the sensibility of a IC pin or a line. For measurements the probe must be in contact with a pin / conducting path and, because of its changing interference pulse intensities from the EFT/burst generator, the sensitivity of the pin / conducting …