P202 / P302 L-EFT set

Pulse Injection Langer Pulses 1.5/5 ns and 1.5/20 ns

The P202 and P302 pulse generators are used to determine an IC's pulse immunity. During a Burst/ESD device test the generated pulse-shaped disturbances reach any ICs in the device under test. To individually test ICs, the pulse generators from LANGER EMV-Technik GmbH simulate these reduced disturban…

P250 set

EFT/Burst Injection up to 6 kV

The P250 probe is used for direct-contact measurements of impulse immunity in IC pins, according to IEC 62215-3 and IEC 61000-4-4. Knowledge of impulse immunity parameters through use of the P250 probe makes optimization of the IC and definition of application requirements possible. The probe P250 h…

P1202-4 / P1302-4 set

EFT/Burst Field Coupling

The field sources, which are included in the probe set EFT/Burst field coupling, generate electric and magnetic EFT/Burst pulse fields. With these fields, ICs are defined and reproducibly pulsed to determine their immunity against EFT/Burst pulse fields. The reason for this is the EFT/Burst immunity…

H4-IC set

EFT/Burst Magnetic Field Source

The BS 06DB-s magnetic field source is used to generate magnetic EFT/burst fields. An EFT/burst generator (IEC 61000-4-4) supplies the field source with an EFT/burst current via an RF cable. The field source generates high magnetic fields (approx. 200 mT) in very small spaces (2.54 mm²). It is thus …

H5-IC set

EFT/Burst Magnetic Field Source

The BS 06DU-s magnetic field source is used to generate magnetic EFT/burst fields. An EFT/burst generator (IEC 61000-4-4) supplies the field source with an EFT/burst current via an RF cable. The field source generates high magnetic fields (approx. 150 mT) in very small spaces. It is thus ideal for c…