Langer EMV - XFS-E 09s, Scanner Probe 30 MHz up to 6 GHz

XFS-E 09s

Scanner Probe 30 MHz up to 6 GHz

Short description

The electrode on the probe head of the XFS-E 09s scanner probe detects electrical fields which, for example are decoupled above the IC’s surface. The probe’s resolution allows for measurements with a distance of 0.5 mm to 10 mm above an assembly. For measurement, the E-field probe is placed on the target.

The XSF-E 09s is a passive near-field probe. To measure, the E-field probe is positioned above or onto components and printed circuit boards. It has a current attenuating sheath and, therefore, its upper half is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The E-field scanner probe has an internal terminating resistance.

Technical parameters

Frequency range	30 MHz ... 6 GHz
Resolution	≈ 0.2 mm
Probe head dimensions:	≈ (10 x 10) mm
Connector - output	SMA, male, jack
Frequency response [dBµV] / [dBµA/m]
E- field correction curve [dBµV/mm] / [dBµV]
Measuring principles