RFS set

Scanner Probes 30 MHz up to 3 GHz

The RFS set consits of three passive near field probes designed for the use in a measurement scanner during the development of E-field and magnetic field.

RFS-R 50

Scanner Probe 30 MHz up to 3 GHz

The RFS-R 50 H-field probe is designed for taking field measurements on assemblies, devices or cables at a distance of up to approx. 3 cm. The H-field probe can be used to identify larger components as sources of interference.

RFS-R 3-2

Scanner Probe 30 MHz up to 3 GHz

The RFS-R 3-2 scanner probe is used for the high-resolution measurement of RF magnetic fields directly on an assembly e.g. in range around pins and IC cases, conducting paths, decoupling capacitor and EMC components.

RFS-R 0.3-3

Scanner Probe 30 MHz up to 3 GHz

With its small probe head, the RFS-R 0.3-3 can measure magnetic fields in very high resolution. Thus even smallest components can be detected as interference sources. Furthermore, the small probe head is suitable for measurements at hard to reach spots, e.g. near IC pins.

RFS-B 3-2

Scanner Probe 30 MHz up to 3 GHz

The measurement coil of the RFS-B 3-2 H-field scanner probe is arranged orthogonally to the probe shaft. This allows the probe head to be positioned very close to the assembly and to achieve a strong coupling. The RFS-B 3-2 detects magnetic field lines, which exit the measuring object othogonally. M…

RFS-B 0.3-3

Scanner Probe 30 MHz up to 3 GHz

The scanner probe RFS-B 0.3-3 is designed for extreme small-scale detection of magnetic field. The coil inside the probe head is positioned at a 90° angle from the shaft. For measurements it can be positioned directly onto the measured object.

RFS-E 03

Scanner Probe 30 MHz up to 3 GHz

Using the approx. 4x4 mm electrode, which is located in the bottom of the RFS-E 03 probe head, E-fields from clocked lines, IC pins, and smaller components can be detected.

RFS-E 10

Scanner Probe 30 MHz up to 3 GHz

The electrode underneath the RF-E 10 scanner probe head has a width of approx. 0.2 mm, which can locate even the smallest E-field sources, e.g. conducting paths with a width of 0.1 mm or, single IC pins at high pin ICs.