LF-U 2.5
H-Field Probe 100 kHz up to 50 MHz
![LF-U 2.5, H-Field Probe 100 kHz up to 50 MHz](/fileadmin/Bilder300/Disturbance emission_near field probe_LF-U 2.5_function_en_wPZ.png?v=1721136997981)
![Probe head](/fileadmin/Bilder300/2014.11.14 Sondenkopf LF-U 2,5 frei_wPZ.jpg?v=1721136997981)
Short description
The H-field probe LF-U 2.5 is a near-field probe. It is designed for the selective detection of RF current in conducting paths, SMD components and IC pins. The head of the probe has a magnetically active gap with a width of approx. 0.5 mm.
The LF-U 2.5 is a near-field probe. It functions like the LF-U 5 probe. While the LF-U 5 is suitable for larger components such as cable, connectors ect., the LF-U 2.5 is designed for SMD components and pins.
When measuring, the magnetically active gap of the probe head is positioned directly onto the measured object.
The near-field probe is small and handy. It has a current attenuating sheath and, therefore, is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe does not have an internal terminating resistance of 50 Ω.