FLS 106 IC set
IC Scanner 4-Axis Positioning System
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FLS 106 with ICR microprobe
Short description
The FLS 106 IC scanner is a 4-axes positioning system that allows for the movement of ICR near-field probes along three linear axes and the rotation of the ICR near-field probes on one axis above an IC in its electronic assembly.
The ICR near-field probes allow for the measurement of high-frequency magnetic or E-fields up to 6 GHz with a high measuring resolution of 50 to 100 µm.
The IC scanner can be set up for surface scans and ESD or EFT immunity tests in a few simple steps.
Scope of delivery
- 1x FLS 106 IC, 4-Axis Positioning System
- 1x CS-Scanner, ChipScan-Scanner Software / USB
- 1x GND 25, Ground Plane
- 1x DM-CAM, Digital Microscope Camera
- 1x Rotary unit, Rotary Unit
- 1x DM-CAM holder.3, Microscope Camera Holder
- 1x FLS 106 IC acc, Accessories for scanner
Recommended products
- ICR Probe, Your selection from our range of near-field microprobes
- ICI 01 L-EFT set, IC EM Pulse Injection Langer Pulse
- XF Product family, Near-Field Probes 30 MHz up to 6 GHz
- SX1 set, Near-Field Probes 1 GHz up to 10 GHz
- PA 306 SMA, Preamplifier 100 kHz up to 6 GHz
- SH 01, Probe Holder for Langer scanner
- UH DUT set, Universal Holder for Langer scanner
Technical parameters
| Supply voltage | 110 V / 230 V |
| Interface | USB |
| Axes x, y, z; α | |
| Max. traverse range | (400 x 600 x 120) mm; α-Rotation ±180° |
| Min. step size | (20 x 20 x 20) µm; α-Rotation 1° |
| Positioning speed | (20 x 25 x 10) mm/s; α-Rotation 90°/s |
| Weight | 75 kg |
| Sizes (L x W x H) | (1030 x 775 x 900) mm |
Scope of delivery details
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FLS 106 IC
4-Axis Positioning System
The FLS 106 4-axis positioning system is used to move near field probes in four axises and to rotate the near field probes above a DUT.
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CS-Scanner
ChipScan-Scanner Software / USB
The ChipScan-Scanner software is used for the automated measurement of electric and magnetic near fields of electronic assemblies. The software enables measurements in a plane or in the volume above the assembly, visualization of the measurement results for fast and accurate evaluation of the near f…
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GND 25
Ground Plane
The GND 25 ground plane ensures the RF-compatible contacting of the probe during an EMC measurement at a test IC. The GND 25 consists of steel with a gold plated surface. The recess (103 mm x 103 mm) is designed for the placement of GNDA ground adapters (GNDA 01-04) and TEM cell prints (100 mm x 100 mm).
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DM-CAM
Digital Microscope Camera
The digital microscope camera is an essential part of a Langer-Scanner and makes it easier to position the near-field probes above the DUT.