typ. - Refer to parameter sheet
ICI E450 L-EFT
Pulse E-Field Source
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Application of ICI E450 L-EFT pulse E-field source
Short description
The ICI E450 L-EFT pulse electric field source couples fast transient pulses into a test IC (open die). This allows for fault injection attacks or testing the immunity of individual areas of the IC.
Technical parameters
| Probe head dimensions: | Ø 450 µm |
| Max. Displacement Current (Stripline 100 µm) | 7 mA |
| Pulse parameter | |
| Rise time | < 2 ns |
| Repetition frequency | 0.1 Hz - 20 kHz |
| Polarity (set by software) | + / - / alternating |
| Measuring output | 50 Ω |
| Trigger-pulse delay (Bypass Mode - Delay Line) | |
| min. Trigger-pulse delay (typ.) | 70 ns |
| max. Trigger-pulse delay (typ.) | 420 ns |
| max. Jitter (typ.) | ± 1 ns |
| Supply voltage | BPS 202 |
| Weight | 70 g |
| Sizes (L x W x H) | (26 x 43 x 53) mm |
| Pulse shape |
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| Transverse scan |
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