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Black cat logo Langer EMV-Technik

  • About us
    • Company
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  • Products
    • PCB Immunity
      • Immunity Development System
      • Mini Burst Field Generators
      • Accessory EFT/Burst generators IEC 61000-4-4
      • Optical Signal Transmission
      • Burstdetector
    • PCB Emission
      • Measurement Technology for the Development Stage
      • Near-Field Probes
      • Preamplifier
      • Near-Field Microprobes
      • Optical Signal Transmission
    • IC Test System
      • IC Test Environment
      • Emission
      • Immunity
      • Simulation
    • IC Security
      • Fault Injection
      • Side-channel analysis
      • Positioning systems
    • Positioning Systems
      • Langer Scanner
      • Accessories for Langer Scanner
      • Near-field Scanner Probes
    • Software
      • CS-Scanner, ChipScan-Scanner Software / USB
      • CS-ESA set, ChipScan-ESA Software / USB
    • Measuring and Calibration Stations
      • PCB
      • IC
      • Connector
    • Equipment for Teaching and Training
      • EMC-Basic 1 set, Demonstration Boards Mini Burst Field Generators
      • EMC-Basic 2 set, Demonstration Boards Near-Field Probes
      • DB 20 set, Demo Board 20
      • D10 set, EMC Demonstration Board
  • Seminars
    • SF-GE, Experimental EMC Seminar - Interference Immunity - Basics & Troubleshooting (3 days)
    • SF-G, EMC Experimental Seminar - Interference Immunity-Basics (2 days)
    • SA-GE, Experimental EMC Seminar - Interference Emission - Basics and Troubleshooting (3 days)
    • SA-G, EMC Experimental Seminar - Interference Emission - Basics (2 days)
    • SF IHS, Experimental EMC Inhouse Seminar - Interference Immunity 3 days
    • SA IHS, Experimental EMC Inhouse Seminar - Emission 2 days
    • Dates Overview
  • Services
    • EMC Workshops
      • WS ESA1, Workshop for Development System Emission
      • WS IC, EMC Workshop for Integrated Circuits
      • WS PCB, EMC-Workshop for Immunity and Emission
      • WS Scanner, Workshop for Langer Scanner
    • IC-EMC Analysis
      • Emission
      • Immunity
    • EMC Analysis
      • SMM Langer, Measuring of electromagnetic Shielding according to Langer method
      • COCI, Measurement of the Coupling Inductance of Connectors and Cables
    • EMV-B, EMC-Consulting / Hour
  • EMC Know-How
    • Technical article Board-EMC
      • Basic Knowledge
      • Immunity
      • Emission
    • Technical article IC-EMC
      • Basic Knowledge
      • Immunity
      • Emission
    • Langer EMV-Technik in scientific research
    • Newsletter
      • 17 ESA1 set
      • 16 ICI-DP sets
      • 15 tent and GP 23 set
      • 14 Mini Burst Field Generators in pocket size
      • 13 Achieve interference immunity by identifying and eliminating EMC weak points:
      • 12 ICR: Near-field analysis in the micrometer range and its advantages
      • 11 ChipSan-ESA now supports more measuring devices
      • 10 P512 and DPI
      • 09 Surface Scan on IC Level with high Resolution
      • 08 ESD and Efficient Electronic Design
      • 07 EMC Measurement Technology for Testing Integrated Circuits - An Introduction
      • 06 Measuring the Shielding Effectiveness at IC Level with the IC Test System P1402/P1502
      • 05 Time and cost savings when recording and documenting RF measurements with a spectrum analyzer
      • 04 Radiated Emissions at the PCB Level - An Introduction
      • 03 Interference suppression on a direct-current motor controlled by PWM
      • 02 XF sniffer probes and LVDS suppression
      • 01 MFA micro probes and LVDS suppression
    • Videos
      • How-to videos
      • EMC Webinar
  • PCB Immunity
  • PCB Emission
    • Measurement Technology for the Development Stage
    • Near-Field Probes
    • Preamplifier
    • Near-Field Microprobes
      • Near-Field Microprobe Sets ICR HH H Field
        • ICR HH100-6 setNear-Field Microprobe 2.5 MHz - 6 GHz
        • ICR HH100-27 setNear-Field Microprobe 1.5 MHz - 6 GHz
        • ICR HH150-6 setNear-Field Microprobe 2.5 MHz - 6 GHz
        • ICR HH150-27 setNear-Field Microprobe 1.5 MHz - 6 GHz
        • ICR HH250-6 setNear-Field Microprobe 2.5 MHz - 6 GHz
        • ICR HH250-75 setNear-Field Microprobe 0.5 MHz - 2 GHz
        • ICR HH500-6 setNear-Field Microprobe 2 MHz - 6 GHz
        • ICR HH500-75 setNear-Field Microprobe 200 kHz - 1 GHz
      • Near-Field Microprobe Sets ICR HV H Field
      • ICR 03 setNear-Field Microprobes Set
      • ICR E150 setNear-Field Microprobe E-field 7 MHz up to 3 GHz
    • Optical Signal Transmission
  • IC Test System
  • IC Security
  • Positioning Systems
  • Software
  • Measuring and Calibration Stations
  • Equipment for Teaching and Training
  • Products
  • PCB Emission
  • Near-Field Microprobes
  • Near-Field Microprobe Sets ICR HH H Field
  • ICR HH100-6 set, Near-Field Microprobe 2.5 MHz - 6 GHz
  • BT 706, Bias Tee for Langer probes

BT 706

Bias Tee for Langer probes

  • Short description
  • Technical parameters
Send enquiry Datasheet
  • BT 706, Bias Tee for Langer probes
  • BT 706 bias tee with MFA-R 0.2-6 near-field micro probe
    BT 706 bias tee with MFA-R 0.2-6 near-field micro probe
BT 706, Bias Tee for Langer probes BT 706 bias tee with MFA-R 0.2-6 near-field micro probe
  • BT 706, Bias Tee for Langer probes
  • BT 706 bias tee with MFA-R 0.2-6 near-field micro probe
Short description

The bias tee is used for the power supply of active near-field probes of the Langer EMV-Technik GmbH, e.g. MFA or ICR. The bias tee is inserted into the signal path between the active near-field probe and the spectrum analyzer or oscilloscope and powered by a plug-in power supply.

Technical parameters
Frequency range 500 kHz - 6 GHz
Supply voltage 12 V / 70 mA
Connector SMA
Sizes (L x W x H) (50 x 38 x 13) mm
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