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RFS-R 3-2

Scanner Probe 30 MHz up to 3 GHz

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RFS-R 3-2, Scanner Probe 30 MHz up to 3 GHz
  • RFS-R 3-2, Scanner Probe 30 MHz up to 3 GHz
Short description

The RFS-R 3-2 scanner probe is used for the high-resolution measurement of RF magnetic fields directly on an assembly e.g. in range around pins and IC cases, conducting paths, decoupling capacitor and EMC components.

The RFS-R 3-2 is a passive near-field probe. The H-field probe is designed to be used very close to the components and where high magnetic field strength occurs. It has a current attenuating sheath and, therefore, is electrically shielded. The magnetic field scanner probe can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe does not have an internal terminating resistance of 50 Ω.

Technical parameters
Frequency response [dBµV] / [dBµA/m] H-field correction curve [dBµA/m] / [dBµV] Current correction curve [dBµA] / [dBµV] Measuring principles
Frequency range 30 MHz ... 3 GHz
Resolution ≈ 1 mm
Probe head dimensions: Ø ≈ 3 mm
Connector - output SMA, male, jack
Frequency response [dBµV] / [dBµA/m] Frequency response [dBµV] / [dBµA/m]
H-field correction curve [dBµA/m] / [dBµV] H-field correction curve [dBµA/m] / [dBµV]
Current correction curve [dBµA] / [dBµV] Current correction curve [dBµA] / [dBµV]
Measuring principles Measuring principles