IC Security
These probes allow for inject fast, transient magnetic field, E-field and current pulses into ICs.
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ICI HH500-15 L-EFT
Pulse Magnetic Field Source
The ICI HH500-15 L-EFT pulse magnetic field source couples fast transient pulses into a test IC (open die). This allows for electromagnetic fault injection (EMFI) attacks or testing the immunity of individual areas of the IC.
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ICI E450 L-EFT
Pulse E-Field Source
The ICI E450 L-EFT pulse electric field source couples fast transient pulses into a test IC (open die). This allows for fault injection attacks or testing the immunity of individual areas of the IC.
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ICI I900 L-EFT
Pulse Current Source (FBBI)
The ICI I900 L-EFT pulse current source couples fast transient pulses into a test IC (Forward body biased injection). This source allows for side channel analysis or testing the immunity of individual areas of the IC.