P331-2 set

ESD Pulse Injection acc. IEC 61000-4-2

The P331-2 probe set is used for conducted coupling of ESD pulses into ICs. The P331-2 probe sizing orientates itself by mechanisms of the ESD coupling into electronic assemblies (according to IEC 61000-4-2 / HMM). The BPS 203 burst power station supplys and controls the probe.

P331 L-ESD set

Langer ESD Pulse 0.2/5 Injection

The P331 L-ESD probe set is used for conducted coupling of Langer ESD pulses (200 ps rise time) into ICs. The P331 L-ESD probe sizing orientates itself by mechanisms of the ESD coupling into electronic assemblies. BPS 203 powers and controls the probe.

P1202-2 set

ESD Magnetic Field Coupling

The field source, which are included in the probe set ESD/magnetic field coupling, generates magnetic ESD fields. With this field, ICs are defined and reproducibly pulsed to determine their immunity against ESD fields. The reason for this is the ESD immunity of PC boards and electrical devices. The…

P1202 / P1301 L-ESD set

ESD Langer Pulse H 0.2/2.5 E 0.2/5.5 ns Field Coupling

The field sources, which are included in the probe set field coupling 200 ps Langer ESD, generate very fast electric and magnetic ESD pulse fields. With these fields, ICs are defined and reproducibly pulsed to determine their immunity against ESD fields. The reason for this is the ESD immunity of PC…