P23
Mini Burst Field Generator (E)
Short description
The P23’s interference pulse is coupled, via its tip, into tested digital IC inputs like Reset, Clock, Quarz or into the respective signal lines. The extremly thin tip of P23 is suitable for testing finest structures.
The coupling takes place capacitively inside the field generator. The tip of the P23 mini generator is positioned galvanically on the pins or signal lines to be tested. Conventional generators and test stations can be used to determine whether a device complies with the standard noise immunity required by law. However, weak spots on an assemby can not be presicely located. Detailed information about their location, susceptibility, and type of action (E-field or B-field susceptibility) are required to easily and efficiently llocate them on the printed circuit board and eliminate them. Mini burst field generators are handy and can be used at the developer’s own workspace.