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XF-R 400-1

H-Field Probe 30 MHz up to 6 GHz

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  • XF-R 400-1, H-Field Probe 30 MHz up to 6 GHz
  • Probe head
    Probe head
XF-R 400-1, H-Field Probe 30 MHz up to 6 GHz Probe head
  • XF-R 400-1, H-Field Probe 30 MHz up to 6 GHz
  • Probe head
Short description

Due to its large diameter (25 mm) and its high resolution, the XF-R 400-1 H-field probe is suitable for measurements at distances up to 10 cm around assemblies and devices.

The XF-R 400-1 is a passive near-field probe. In principle it has the same structure as the XF-R 100-1 and XF-R 3-2 probes. The near-field probe is small and handy. It has a current attenuating sheath and, therefore, is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe has an internal terminating resistance.

Technical parameters
Frequency response [dBµV] / [dBµA/m] H-field correction curve [dBµA/m] / [dBµV] Current correction curve [dBµA] / [dBµV] Measuring principles
Frequency range 30 MHz ... 6 GHz
Probe head dimensions: Ø ≈ 25 mm
Connector - output SMA, female, jack
Weight 15 g
Frequency response [dBµV] / [dBµA/m] Frequency response [dBµV] / [dBµA/m]
H-field correction curve [dBµA/m] / [dBµV] H-field correction curve [dBµA/m] / [dBµV]
Current correction curve [dBµA] / [dBµV] Current correction curve [dBµA] / [dBµV]
Measuring principles Measuring principles