XF-R 400-1
H-Field Probe 30 MHz up to 6 GHz
![XF-R 400-1, H-Field Probe 30 MHz up to 6 GHz](/fileadmin/Bilder300/Disturbance emission_near field probe_XF-R 400_function_en_wPZ.png?v=1723643593082)
![Probe head](/fileadmin/Bilder300/2014 Sondenkopf XF-R 400_wPZ.jpg?v=1723643593082)
Short description
Due to its large diameter (25 mm) and its high resolution, the XF-R 400-1 H-field probe is suitable for measurements at distances up to 10 cm around assemblies and devices.
The XF-R 400-1 is a passive near-field probe. In principle it has the same structure as the XF-R 100-1 and XF-R 3-2 probes. The near-field probe is small and handy. It has a current attenuating sheath and, therefore, is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe has an internal terminating resistance.