RF Product family
Near-Field Probes 30 MHz up to 3 GHz
Short description
The RF family are passive field probes for measurements of the magnetic field in the development phase in the range from 30 MHz to 3 GHz. An individual probe set is compiled according to the customer`s need.
The probe heads of the RF family allow the step by step identification of interference sources on an assembly.We recommend initially the detection of interference sources on assemblies by using large sensitive probes from a larger distance. Next, using higher resolution probes, the interference sources can be more precisely detected. With trained use of the near field probes field orientation and field distribution on the electronic assembly can be detected. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded.
They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
Scope of delivery
- 1x RF-E 02, E-Field Probe 30 MHz up to 1.5 GHz
- 1x RF-E 03, E-Field Probe 30 MHz up to 3 GHz
- 1x RF-E 04, E-Field Probe 30 MHz up to 3 GHz
- 1x RF-E 05, E-Field Probe 30 MHz up to 3 GHz
- 1x RF-E 09, E-Field Probe 30 MHz up to 3 GHz
- 1x RF-E 10, E-Field Probe 30 MHz up to 3 GHz
- 1x RF-K 7-4, H-Field Probe 30 MHz up to 1 GHz
- 1x RF-B 0.3-3, H-Field Probe mini 30 MHz up to 3 GHz
- 1x RF-B 3-2, H-Field Probe 30 MHz up to 3 GHz
- 1x RF-B 50-1, H-Field Probe 30 MHz up to 3 GHz
- 1x RF-R 0.3-3, H-Field Probe mini 30 MHz up to 3 GHz
- 1x RF-R 3-2, H-Field Probe 30 MHz up to 3 GHz
- 1x RF-R 50-1, H-Field Probe 30 MHz up to 3 GHz
- 1x RF-R 400-1, H-Field Probe 30 MHz up to 3 GHz
- 1x RF-U 2.5-2, H-Field Probe 30 MHz up to 3 GHz
- 1x RF-U 5-2, H-Field Probe 30 MHz up to 3 GHz
Technical parameters
| Frequency range | 30 MHz ... 3 GHz |
| Connector | SMB, male,jack |
Scope of delivery details
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RF-E 02
E-Field Probe 30 MHz up to 1.5 GHz
The RF-E 02 near-field probe detects electrical fields that are decoupled from bus structures, larger components or supply surfaces. The electrode surface on the underside of the probe tip is approx. 2 cm x 5 cm. The probe functions best within distances of 1 cm - 2 cm from the component.
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RF-E 03
E-Field Probe 30 MHz up to 3 GHz
The electrode underneath the RF-E 03 probe head is approx. 4 x 4 mm. With it small E field sources can be localized, e.g. conducting paths, single component of Printed circuit boards. The RF-E 03 probe was developed for Langer scanner.
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RF-E 04
E-Field Probe 30 MHz up to 3 GHz
The electrode on the underside of RF-E 04 probe head detects electrical fields which are decoupled by clocked lines and ICs. The resolution of the probe allows for measurements with a distance from 0,5 to 10 mm above the assembly. The RF-E 04 probe was developed for Langer scanner.
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RF-E 05
E-Field Probe 30 MHz up to 3 GHz
The electrode at the underside of the probe head of the RF-E 05 has a width of approx. 0.5 mm. The E-fields of clocked lines, IC pins, and smaller components are precisely located. The RF-E 05 probe was developed for Langer scanner.
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RF-E 09
E-Field Probe 30 MHz up to 3 GHz
The electrode on the underside of RF-E 09 probe head detects electrical fields decoupled by ICs. The resolution of the probe enables measurements from distances of 0,5 to 10 mm above assemblies. The RF-E 09 probe was developed for Langer scanner.
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RF-E 10
E-Field Probe 30 MHz up to 3 GHz
The electrode on the lower edge of the RF-E 10 probe head has a width of approx. 0.2 mm, which can locate even the smallest E-field sources, e.g. conducting paths with a width of 0.1 mm or, single IC pins at high pin ICs.
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RF-K 7-4
H-Field Probe 30 MHz up to 1 GHz
The RF-K 7-4 near-field probe detects semi-circular magnetic field lines entering the probe head reversely. Such magnetic field lines occur at traces, rodlike constructional components, cable connectors, and along edges of areal constructional components. The probe functions like a coupling clamp.
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RF-B 0.3-3
H-Field Probe mini 30 MHz up to 3 GHz
The H-field probe RF-B 0.3-3 is designed for extreme small-scale detection of magnetic field lines entering at 90° angles into the probe tip. The coil inside the probe head is positioned at a 90° angle from the shaft. For measurements it can be positioned directly onto the measured object.
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RF-B 3-2
H-Field Probe 30 MHz up to 3 GHz
The measurement coil of the RF-B 3-2 H-field probe is set at a 90° angle to the probe shaft. By positioning the probe head vertically, the measurement coil touches the surface of the printed circuit board directly. This allows for use at places on the surface of printed circuit boards, which are typ…
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RF-B 50-1
H-Field Probe 30 MHz up to 3 GHz
The H-field probe RF-B 50-1 was developed for the Langer scanner and is used for the extremely small-scale detection of magnetic field lines entering the probe tip orthogonally. By positioning the probe head vertically, the measurement coil touches the surface of the printed circuit board directly.
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RF-R 0.3-3
H-Field Probe mini 30 MHz up to 3 GHz
With its small probe head, the RF-R 0.3-3 can measure magnetic fields in very high resolution. Thus even smallest components can be detected as interference sources. Furthermore, the small probe head is suitable for measurements at hard to reach spots, e.g. near IC pins.
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RF-R 3-2
H-Field Probe 30 MHz up to 3 GHz
The RF-R 3-2 near-field probe is used for the high-resolution measurement of RF magnetic fields directly on an assembly e.g. in range around pins and IC cases, conducting paths, decoupling capacitor and EMC components.
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RF-R 50-1
H-Field Probe 30 MHz up to 3 GHz
The RF-R 50-1 H-field probe is designed for measurements at assemblies, devices, or cables at distances up to approx. 3 cm. The H-field probe can identify larger components as interference sources.
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RF-R 400-1
H-Field Probe 30 MHz up to 3 GHz
Due to its large diameter (25 mm) the RF-R 400-1 H-field probe is highly sensitive and is suitable for measurements at distances up to 10 cm around assemblies and devices.
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RF-U 2.5-2
H-Field Probe 30 MHz up to 3 GHz
The RF-U 2.5-2 near-field probe is designed for the selective measurements of RF currents in conducting paths, component connectors, SMD components, and IC-pins. The probe head has a magnetically active gap with an approx. width of 0.5 mm. To use, the head should be positioned directly onto the meas…
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RF-U 5-2
H-Field Probe 30 MHz up to 3 GHz
The RF-U 5-2 H-field probe is designed for detecting magnetical fields at broad conducting paths, cables, connectors, electronic components and their connections. The probe functions like a coupling clamp.