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ICS 105 set

IC Scanner 4-Axis Positioning System

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  • ICS 105 set, IC Scanner 4-Axis Positioning System
  • ICS 105 application with CS-Scanner software
    ICS 105 application with CS-Scanner software
  • ICS 105 with SH 01 probe holder
    ICS 105 with SH 01 probe holder
  • ICS 105 with UH DUT universal holder
    ICS 105 with UH DUT universal holder
  • ICS 105 set with UH DUT universal holder and device under test
    ICS 105 set with UH DUT universal holder and device under test
ICS 105 set, IC Scanner 4-Axis Positioning System ICS 105 application with CS-Scanner software ICS 105 with SH 01 probe holder ICS 105 with UH DUT universal holder ICS 105 set with UH DUT universal holder and device under test
  • ICS 105 set, IC Scanner 4-Axis Positioning System
  • ICS 105 application with CS-Scanner software
  • ICS 105 with SH 01 probe holder
  • ICS 105 with UH DUT universal holder
  • ICS 105 set with UH DUT universal holder and device under test
Short description

The ICS 105 IC scanner allows for measurements of high-frequency near fields above ICs. Depending on the used ICR near-field microprobe magnetic or electric fields can be measured with a measuring resolution of 50 to 100 µm. The probe can also be automatically rotated to determine the magnetic field’s direction.

Optionally the ICS 105 scanner can be used for measurements above small assemblies in combination with UH-DUT universal holder and SH 01 probe holder.

The IC scanner can be set up for ESD or EFT immunity tests on ICs in a few simple steps.

Scope of delivery
Technical parameters
3D scan Surface scan
Supply voltage 110 / 230 V
Interface USB
Max. traverse range (50 x 50 x 50) mm; α-Rotation ±180°
Min. step size (10 x 10 x 10) µm; α-Rotation 1°
Positioning speed (10 x 10 x 5) mm/s; α-Rotation 90°/s
Weight 23 kg
Sizes (L x W x H) (350 x 400 x 420) mm
3D scan 3D scan
Surface scan Surface scan
Scope of delivery details