LF Product family
Near-Field Probes 100 kHz up to 50 MHz
Short description
The LF near field probe family consists of 7 shielded near field probes for making measurements in the development phase of RF magnetic field in the long wave, medium wave and short wave range of electronic assemblies. The probes are arranged to suit the costumer`s need.
The probe heads of the LF family allow for the step by step localization of interference sources on assemblies. At first the large and more sensitive probes detect electromagnetic interference of assemblies from a greater distance. Subsequent probes of higher resolution locate interference sources more precisely. Field orientation and field distribution on an electronic assembly can be detected trough trained use of the near field probe.
The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
Scope of delivery
- 1x LF-B 3, H-Field Probe 100 kHz up to 50 MHz
- 1x LF-K 7, H-Field Probe 100 kHz up to 50 MHz
- 1x LF-R 3, H-Field Probe 100 kHz up to 50 MHz
- 1x LF-R 50, H-Field Probe 100 kHz up to 50 MHz
- 1x RF-R 400-1, H-Field Probe 30 MHz up to 3 GHz
- 1x LF-U 2.5, H-Field Probe 100 kHz up to 50 MHz
- 1x LF-U 5, H-Field Probe 100 kHz up to 50 MHz
Technical parameters
| Frequency range | 100 kHz ... 50 MHz |
| Connector | SMB, male, jack |
Scope of delivery details
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LF-B 3
H-Field Probe 100 kHz up to 50 MHz
The measuring coil of the H-field probe LF-B 3 sits orthogonally to the shaft. Using the probe tip perpendicularly ensures its correct placement directly on the assembly or device to be measured. This allows for use at places on the surface of printed circuit boards typically hard to access, e.g. be…
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LF-K 7
H-Field Probe 100 kHz up to 50 MHz
The LF-K 7 near-field probe has two coils, which detect semi-circular magnetic field lines. Such magnetic field lines occur at lines, rod-like constructional components, cable connectors, and along edges of flat constuctional components. The probe functions like a coupling clamp.
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LF-R 3
H-Field Probe 100 kHz up to 50 MHz
The LF-R 3 near-field probe detects high resolution RF magnetic fields directly on assemblies, for example, in the area around IC pins and IC cases, conducting paths, decoupling capacitor, and EMC components.
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LF-R 50
H-Field Probe 100 kHz up to 50 MHz
The H-field probe LF-R 50 is designed to measure assemblies, devices, or cables at a distance up to 3 cm. This allows larger components to be detected as possible sources of interference.
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RF-R 400-1
H-Field Probe 30 MHz up to 3 GHz
Due to its large diameter (25 mm) the RF-R 400-1 H-field probe is highly sensitive and is suitable for measurements at distances up to 10 cm around assemblies and devices.
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LF-U 2.5
H-Field Probe 100 kHz up to 50 MHz
The H-field probe LF-U 2.5 is a near-field probe. It is designed for the selective detection of RF current in conducting paths, SMD components and IC pins. The head of the probe has a magnetically active gap with a width of approx. 0.5 mm.
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LF-U 5
H-Field Probe 100 kHz up to 50 MHz
The H-field probe LF-U 5 is specially designed for detecting magnetic fields at wide conducting paths, cables, connectors, electronic components, cables and their connectors. The probe functions like a coupling clamp.