Langer EMV - ICIM TEM, Measurement service IC Immunity Measurement TEM Cell Method acc. IEC 62132-2

ICIM TEM

Measurement service IC Immunity Measurement TEM Cell Method acc. IEC 62132-2

Short description

The ICIM TEM measurement service determines the immunity of an IC to high-frequency radiated emission in the frequency range from 150 kHz to 1 GHz in accordance with the IEC 62132-2 standard. The test IC is mounted on an IC measurement adapter printed circuit board (PCB), which is fixed in a suitable opening of the TEM cell (transverse electromagnetic cell). The IC measurement adapter PCB thus becomes part of the cell wall and the test IC is located inside the TEM cell.

What is needed from the Customer?

Data sheet of the IC
Test circuit diagram (in coordination with test engineer)
Test firmware with description (in coordination with test engineer)
5 ICs with test firmware

What does the Customer get?

5 test PCBs, assembled/unassembled, depending on the number of test ICs
Documentation of the measurement results
Test report (Test Report - TEM Cell Emission)

The preparation of a quotation depends on the exact measurement task (e.g. number of test modes, frequency range) of the customer. Please contact the sales department of Langer EMV-Technik GmbH.