An assembly (device under test) often has a majority of less-sensitive and insensitive signal connections (conducting paths, IC pins). The sensitive signal connections can be easily detected by the mini burst generator and protected through appropriate layout changes. Conventional generators and test stations can be used to determine whether a device complies with the standard noise immunity required by law. However, weak spots on an assemby can not be presicely located. Detailed information about their location, susceptibility and type of action (E-field or B field susceptibility) are required to easily and efficiently locate them on the printed circuit board and eliminate them. Mini burst field generators are handy and can be used at the developer’s own workspace.