Contact us
Career
Terms and Conditions
Payment form
DE
EN
CN
About us
Company
Career
Terms and Conditions
Company Profile
Milestones
Distributors
Asia
Australia/New Zealand
Europe
North America
Contact us
Map and Travel Information
Sponsoring
Events
Payment form
Products
PCB Immunity
Immunity Development System
Mini Burst Field Generators
Accessory EFT/Burst generators IEC 61000-4-4
Optical Signal Transmission
Burstdetectors
PCB Emission
Measurement Technology for the Development Stage
Near-Field Probes
Preamplifier
Near-Field Microprobes
Optical Signal Transmission
IC Test System
IC Test Environment
Emission
Immunity
Simulation
IC Security
Fault Injection
Side-channel analysis
Positioning systems
Positioning Systems
Langer Scanner
Accessories for Langer Scanner
Near-field Scanner Probes
Software
CS-Scanner, ChipScan-Scanner Software / USB
CS-ESA set, ChipScan-ESA Software / USB
Measuring and Calibration Stations
PCB
IC
Connector
Epuipment for Teaching and Training
EMC-Basic 1 set, Demonstration Boards Mini Burst Field Generators
DB 20 set, Demo Board 20
D10 set, EMC Demonstration Board
Seminars
SF1, Experimental EMC Seminar - Interference Immunity 1
SF2, Experimental EMC Seminar - Interference Immunity 2
SA1, Experimental EMC Seminar - Emission 1
SA2, Experimental EMC Seminar - Emission 2
SF IHS, Experimental EMC Inhouse Seminar - Interference Immunity 3 days
SA IHS, Experimental EMC Inhouse Seminar - Emission 2 days
Dates Overview
Services
EMC Workshops
WS ESA1, Workshop for Development System Emission
WS IC, EMC Workshop for Integrated Circuits
WS PCB, EMC-Workshop for Immunity and Emission
WS Scanner, Workshop for Langer Scanner
IC-EMC Analysis
Emission
Immunity
EMC Analysis of Plug-and-Socket Connectors and Cables
COCI, Measurement of the Coupling Inductance of Connectors and Cables
EMV-B, EMC-Consulting / Hour
EMC Know-How
Technical article Board-EMC
Basic Knowledge
Immunity
Emission
Technical article IC-EMC
Basic Knowledge
Immunity
Emission
Langer EMV-Technik in scientific research
Newsletter
10 P512 and DPI
09 Surface Scan on IC Level with high Resolution
08 ESD and Efficient Electronic Design
07 EMC Measurement Technology for Testing Integrated Circuits - An Introduction
06 Measuring the Shielding Effectiveness at IC Level with the IC Test System P1402/P1502
05 Time and cost savings when recording and documenting RF measurements with a spectrum analyzer
04 Radiated Emissions at the PCB Level - An Introduction
03 Interference suppression on a direct-current motor controlled by PWM
02 XF sniffer probes and LVDS suppression
01 MFA micro probes and LVDS suppression
Videos
How-to videos
EMC Webinar
PCB Immunity
PCB Emission
Measurement Technology for the Development Stage
ESA1 set
Emission Development System
HFW 21 set
RF Current Transformer 100 kHz up to 1 GHz
Z23-1 set
Shielding Tent (900 x 500x 400) mm
Z23-2 set
Shielding Tent (900 x 500 x 650) mm
NNB 21 set
Line Impedance Stabilisation Network
Near-Field Probes
Preamplifier
Near-Field Microprobes
Optical Signal Transmission
IC Test System
IC Security
Positioning Systems
Software
Measuring and Calibration Stations
Epuipment for Teaching and Training
Products
PCB Emission
Measurement Technology for the Development Stage
ESA1 set, Emission Development System
HFA 21, RF Bypass
HFA 21
RF Bypass
Technical parameters
Send enquiry
Datasheet
Application
Technical parameters
Capacitances
10 pF ... 100 nF
Dielectric strength
50 V
Sizes (L x W x H)
(70 x 50 x 18) mm