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ICEM 1-150

Measurement service for IC Emission using 1 Ohm/150 Ohm method acc. to IEC 61967-4

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Short description

The ICEM 1-150 measurement service determines the conducted electromagnetic emission (EME) of a test IC by directly measuring the radio frequency (RF) current with a 1 Ω probe and measuring the RF voltage with a 150 Ω coupling network acc. to IEC 61967-4 standard.
Frequency range: 150 kHz – 3 GHz

P603 and P750 circuit diagram acc. to IEC 61967-4
Advantage of Measurements with P603 and P750

When measuring interference emission with the probes P603 and P750, each individual IC pin (e.g. QFP, QFN packages) or even the balls of a BGA can be contacted and measured individually.
The measurement is in accordance with the 1 ohm/150 ohm method of IEC 61967-4, with the networks normally connected at the pin for measurement included in the RF current or voltage probe . Furthermore, this allows the frequency range of the measurements to be extended up to 3 GHz.

What is needed from the Customer?
  • Data sheet of the IC
  • Test circuit diagram (in coordination with test engineer)
  • Test firmware with description (in coordination with test engineer)
  • 3 - 5 ICs with test firmware
What does the Customer get?
  • 5 test PCBs, assembled/unassembled, depending on the number of test ICs
  • Documentation of the measurement results with ChipScan-ESA software
  • Test report

The preparation of a quotation depends on the exact measurement task (e.g. number of pins, frequency range) of the customer. Please contact the sales department of Langer EMV-Technik GmbH.