XFS-E 09s
Scanner Probe 30 MHz up to 6 GHz
![XFS-E 09s, Scanner Probe 30 MHz up to 6 GHz](/fileadmin/Bilder300/Disturbance emission_near field probe_XF-E 09s_function_en_wPZ.png?v=1724482804101)
![](/fileadmin/Bilder300/2017.08.16 XFS-E 09s Scanner-Sonde.jpg?v=1724482806643)
Short description
The electrode on the probe head of the XFS-E 09s scanner probe detects electrical fields which, for example are decoupled above the IC’s surface. The probe’s resolution allows for measurements with a distance of 0.5 mm to 10 mm above an assembly. For measurement, the E-field probe is placed on the target.
The XSF-E 09s is a passive near-field probe. To measure, the E-field probe is positioned above or onto components and printed circuit boards. It has a current attenuating sheath and, therefore, its upper half is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The E-field scanner probe has an internal terminating resistance.