P603-1 / P750 set
RF Conducted Measurement IEC 61967-4, 1 Ohm / 150 Ohm
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Application with P603-1 -
Scheme measurement set-up with P750
Short description
The probe set is used to measure conducted emissions (measurements with direct 1 Ohm/150 Ohm-coupling) according to IEC 61967-4 at IC pins. For the current and voltage measurement there is one respective probe available. Every Test-IC pin can be reached and contacted by the probe.
The measurements with the probe set guarantee a high precision when repeated and comparability of measurements.
The ICE1 IC test environment of Langer EMV-Technik is used to start the test IC. measurements can be done with ChipScan-ESA software. Measurement results of all measured pins are saved in the software and can be compared fast and systematically.
Scope of delivery
- 1x P603-1, RF Current Probe 1 Ohm
- 1x P750, RF Voltage Probe 150 Ohm
- 1x CS-ESA, ChipScan-ESA Software / USB
- 1x SMA-SMB 1 m, SMA-SMB Measuring Cable
- 1x NT FRI EU, Power Supply Unit
- 1x P603 / P750 case, System Case
- 1x P603-1 / P750 m, P603 / P750 Set User Manual
Recommended products
Scope of delivery details
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P603-1
RF Current Probe 1 Ohm
The P603-1 probe is a 1-Ω-probe for direct measurement of high frequency (RF) current at IC pins. It is used to measure at ground pins (Vss) and signal pins. The RF current probe 1 Ohm has a pin contact with which every IC pin can be separately contacted and measured.
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P750
RF Voltage Probe 150 Ohm
The P750 RF voltage probe corresponds to a 150 ohm coupling network according to IEC 61967-4 for the RF voltage measurement at IC pins. The P750 probe has of a high resistance, capacitive coupled input. RF voltages can be measured at different pins of the device under test.
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CS-ESA
ChipScan-ESA Software / USB
The ChipScan-ESA is a software used for the remote control of a spectrum analyzer. The software is delivered with an installation USB thumb drive. After installation, the full version in conjunction with a dongle (USB interface) is ready for operation.