XF-B 3-1
磁场探头(30MHz-6Hz)
Short description
XF-B 3-1型磁场探头的测量线圈相对垂直于探头柄。当探头竖直放置到电路板上时,其测量线圈直接平放在电路板的表面上。由此就能够测量到印刷电路板表面上很难达到的一些位置,如开关调节器的大元件之间的位置。
The XF-B 3-1 is a passive near-field probe which detects magnetic field lines emitted from the measured object at 90°. Magnetic field lines which enter the probe laterally are not detected.
In contrast to the XF-R 3-1 H-field probe, its coil is positioned in the probe tip at a 90° angle.
The near-field probe is small and handy. It has a current attenuating sheath and, therefore, is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe has an internal terminating resistance.