资讯
我们通过简讯(Newsletter)的方式向您介绍我们在EMC方面成功的经验。简讯内容主要包括电磁兼容技术方面的专业信息和知识,并以电子邮件的形式发送。
欢迎订阅我们的简讯,详情请垂询 女士:newsletter@langer-emv.de。
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09Surface Scan on IC Level with high Resolution
This article focuses on measurements with E-field and H-field microprobes.
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08 ESD and Efficient Electronic Design
This article focuses on the impact of IC behavior on electronic design, specifically ESD characteristics and how they influence a device by influencing its ICs.
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07 EMC Measurement Technology for Testing Integrated Circuits - An Introduction
Using the IC measurement technology of the Langer EMV-Technik GmbH for precompliant testing of the electromagnetic compatibility of integrated circuits and allocation of the testing systems to the (international) standards.
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06 Measuring the Shielding Effectiveness at IC Level with the IC Test System P1402/P1502
Measuring the immunity and shielding effectiveness separately for the electric and magnetic field
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05 Time and cost savings when recording and documenting RF measurements with a spectrum analyzer
Software secures and documents numerous EMC measurements
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04 Radiated Emissions at the PCB Level - An Introduction
Identifying EMI interference sources with near-field probes on the PCB
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03 消除脉宽调制 (PWM) 直流电机的电磁骚扰
Emission measurements with the NNB 21 line impedance stabilization network or HFW 21 RF current transformer and the ChipScan-ESA software for spectrum analyzers from Langer EMV-Technik GmbH
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使用朗格尔(Langer EMV-Technik GmbH)近场探头实现至6 GHz的测量
Interference suppression of LVDS connections with near-field probes
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01 EMC实用技巧和建议 如何使用近场探头抑制LVDS连接的干扰
MFA and ChipScan-ESA for measuring emitted interference of the common mode currents