XFS-E 09s
SMA
![XFS-E 09s, SMA](/fileadmin/Bilder300/Disturbance emission_near field probe_XF-E 09s_function_en_wPZ.png?v=1724482804101)
![](/fileadmin/Bilder300/2017.08.16 XFS-E 09s Scanner-Sonde.jpg?v=1724482806643)
The XSF-E 09s is a passive near-field probe. To measure, the E-field probe is positioned above or onto components and printed circuit boards. It has a current attenuating sheath and, therefore, its upper half is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The E-field scanner probe has an internal terminating resistance.