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P603-1 / P750 set

基于IEC61967-4标准的传导发射测量

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  • P603-1 / P750 set, 基于IEC61967-4标准的传导发射测量
  • Application with P603-1
    Application with P603-1
  • Scheme measurement set-up with P750
    Scheme measurement set-up with P750
P603-1 / P750 set, 基于IEC61967-4标准的传导发射测量 Application with P603-1 Scheme measurement set-up with P750
  • P603-1 / P750 set, 基于IEC61967-4标准的传导发射测量
  • Application with P603-1
  • Scheme measurement set-up with P750
Short description

该探头套组用于测量IC引脚的传导发射（采用1欧姆/150欧姆直接耦合进行测量）。它基于IEC61967-4标准，分别有一个用于测试电流和电压的探头。该探头能够接触到测试IC的每个引脚。

该探头套组能够确保较高的测量重复精度和测量的可比较性。

使用朗格尔电磁兼容技术公司的ICE1集成电路IC测试环境，可以对待测集成电路进行测试。芯片扫描ChipScan-ESA 软件系统可以控制测量过程，并对所有引脚的测量数据进行存储以及快速系统地分析比较。

The measurements with the probe set guarantee a high precision when repeated and comparability of measurements.
The ICE1 IC test environment of Langer EMV-Technik is used to start the test IC. measurements can be done with ChipScan-ESA software. Measurement results of all measured pins are saved in the software and can be compared fast and systematically.

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