Seminar Content

The content of the EMC seminar consists of the sections EMC basics and practical troubleshooting.

The EMC experimental seminar Immunity - Basics and Troubleshooting teaches methods for analyzing and optimizing the EMC properties of circuits and devices. Furthermore, the focus is on recognizing the causes of interference immunity problems with burst, ESD, and RF coupling (conducted or via antenna) and their elimination.The seminar participants carry out many experiments themselves on all key topics. They check the knowledge acquired and gain experience in using measurement instruments.In the three-day seminar, the focus is on fault analysis and practical troubleshooting in the event of interference immunity problems. Using numerous practical examples, steps for troubleshooting of assemblies with appropriate EMC measuring instruments are presented.Your basic understanding of EMC will be deepened. Special EMC problems such as signal interference at interfaces or interference from ESD are explained in context. In the seminar, you will independently examine and suppress interference in a module at your own experimental station.

Interference of electronic devices

• Barrier model, uncertainties in device EMC
• EMC effect mechanisms inside the circuit
• Evaluation of IC sensitivity
• Theoretical and experimental investigations of the various types of IC interference (galvanic, magnetic, and electrical coupling)
• Dependence on device design and IC sensitivity

Interference on the PCB - electrical component

• Interference of the input and output parameters of integrated circuits
• Effect of the electrical influencing component in the circuit/module; dependencies of the effect; countermeasures
• Additional measures outside the circuit in case of insufficient immunity of the device (shielding)

Interference on the PCB - magnetic component

• Effect of the magnetic interference component in the circuit/assembly; dependencies of the effect; countermeasures
• Localization of sensitive structures with near-field probes
• Additional measures outside the circuit in case of insufficient immunity of the device (choking)

Practical interference suppression of an electronic control system with microcontroller

• Interference mechanism and time behavior
• Determining functional faults for electrical and magnetic interference
• Finding weak points with field sources
• Evaluation of weak points

Signal interference at interfaces and device design

• Model for signal interference at interfaces
• High/low pass model; electrical coupling
• Voltage limitation with non-linear elements
• Unshielded/shielded cables - cable connection and shield connection
• ESD effect mechanisms

Organisational matters

Registration

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