RF-E 04
电场探头(30MHz-3GHz)
![RF-E 04, 电场探头(30MHz-3GHz)](/fileadmin/Bilder300/Disturbance emission_near field probe_RF-E 04_function_en_wPZ.png?v=1721124529905)
![Probe head](/fileadmin/Bilder300/2014.11.14 Sondenkopf RF-E 04_wPZ.jpg?v=1721124532028)
Short description
RF-E 04型探头用于检测由时钟线和IC表面产生的电场,其灵敏度允许在一定的距离(0.5mm到10mm)检测电子模块的电场。
The RF-E 04 is a passive near-field probe. In principle it has the same structure as the RF-E 03 and RF-E 09 probes. With its small square electrode surface, the specific source of the electrical interference field can be detected. When measuring, the E-field probe is held above or positioned onto components and printed circuit boards. The near-field probe is small and handy. The upperside is electrically shielded. It has a current attenuating sheath and, therfore, is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The E-field probe does not have an internal terminating resistance of 50 Ω.