XF-R 100-1
磁场探头(30MHz-6GHz)
 
        				
        					
        						 
        					
        
        					Short description
XF-R 100-1型磁场探头用于测量模块、设备或电缆,可以在距离被测物3cm以内使用。利用该磁场探头能够识别较大组件是否为潜在的干扰源。这种磁场探头呈现很高的带宽和线性度。
The XF-R 100-1 is a passive near-field probe. The probe head’s size, and thus its resolution range, is between that of the XF-R 400-1 (25 mm) and XF-R 3-1 (3mm) probes. The near-field probe is small and handy. It has a current attenuating sheath and, therefore, is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe has an internal terminating resistance.
 
           
          ![频率特性 [dBµV] / [dBµA/m]](/fileadmin/Bilder300/Disturbance emission_near field probe_XF-R 100_frequency response_en_wPZ.png?v=1761788442469) 
        									![磁场校正曲线 [dBµA/m] / [dBµV]](/fileadmin/Bilder300/Disturbance emission_near field probe_XF-R 100_H-field correction curve_en_wPZ.png?v=1761788442469) 
        									![电流校正曲线 [dBµA] / [dBµV]](/fileadmin/Bilder300/Disturbance emission_near field probe_XF-R 100_current correction curve_en_wPZ.png?v=1761788442469)