When a magnetic disturbance field couples into a low impedance loop connected to a pin of the test IC, a disturbance voltage will be induced. This voltage drives a disturbance current pulse into the IC pin and can lead to functional interferences.
This coupling mechanism can be simulated by a low-impedance pulse-current source, such as the P202 generator (≈ 1 Ω). The pulse voltage is adjustable within the range of ± (0.5 - 40) V. The L-EFT generator is operated with the BPS 202 and the BPS 202-Client software. To test ICs at the measuring station the ICE1 test environment is required. For automated testing the ICE1 as well as the ICT1 IC tester is required.
Additional equipment may be needed for other measurements (Oscilloscope, PC).