XFS-E 10
![XFS-E 10](/fileadmin/Bilder300/Disturbance emission_near field probe_XF-E 10_function_en_wPZ.png?v=1721652250376)
![](/fileadmin/Bilder300/2017.08.16 XFS-E 10 Scanner-Sonde.jpg?v=1721652252834)
The XFS-E 10 probe is a passive near-field probe. Normally the probe head is positioned directly onto the measured object (high electric field strength). It has a current attenuating sheath and, therefore, is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field scanner probe has an internal terminating resistance.