IC Security
With the products for IC security, ICs can be analyzed in detail using electromagnetic side-channel analysis (SCA) and their function can be specifically faulted with electromagnetic disturbance pulses (EMFI).
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Fault Injection
The ICI and ICI-DP probes allow for inject fast, transient magnetic or electric fields as well as current pulses into ICs. They are intended to use for electromagnetic fault injection (EMFI) or body biasing injection (BBI).
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The near-field microprobes can be used for E- and H-field measurements during development in the frequency range from 0.5 MHz to 6 GHz with a resolution of 60 µm to 300 µm.
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Positioning systems
Automated positioning solutions (IC scanners) for IC injection probes (ICI and ICI-DP) and near-field microprobes (ICR) from Langer EMV-Technik GmbH.