SX-R 3-1
磁场探头(1GHz-10GHz)
![SX-R 3-1, 磁场探头(1GHz-10GHz)](/fileadmin/Bilder300/Disturbance emission_near field probe_SX-R 3-1_function_en_wPZ.png?v=1725087604442)
![Probe head](/fileadmin/Bilder300/2014 Sondenkopf SX-R 3-1_wPZ.jpg?v=1725087606944)
Short description
SX-R 3-1型磁场探头尺寸小,用于高分辨率测量高频磁场,因而能够识别出作为潜在干扰源的最小元件。此外,由于探头尺寸小,适于测量很难靠近的位置,例如集成电路引脚的周围区域。
The SX-R 3-1 is a passive near-field probe. The probe head is very small and therefore suitable for detection of magnetic-field distribution, e.g. at ICs. Because of its compact design, the SX-R 3-1 can be used at hard to reach spots ,e.g. between components. It has a current attenuating sheath and its upper side is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input.